The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We successfully implemented a one-transistor (1T) ferroelectric field effect transistor (FeFET) eNVM into a 28nm gate-first super low power (28SLP) CMOS technology platform using two additional structural masks. The electrical baseline properties remain the same for the FeFET integration and the JTAG-controlled 64 kbit memory shows clearly separated states. High temperature retention up to 250 °C...
Ferroelectric Field Effect Transistor (FeFET) is a promising nonvolatile device which provides high integration density, fast programming speed, and excellent CMOS compatibility. In general, the non-volatility of FeFET is impacted by its physical structure and there is a trade-off between data retention time and device endurance. To improve the cell endurance, for example, the ferroelectric layer...
Novel nonvolatile programmable switch for low-power and high-speed FPGA where MONOS flash is adjacently integrated to CMOS logic is demonstrated. The MONOS transistors (MTrs.) and low-voltage switching transistors (SwTrs.) are fabricated close to each other without deteriorating each performance. Furthermore, memory programming scheme is optimized to realize selective writing with no damage in the...
The charge storage of the nonvolatile Metal Insulator Oxide Semiconductor (MIOS) memory devices was studied and investigated using an efficient programming and measuring equipments in order to characterize the MIOS performances. Positive and negative voltages are applied to a device fabricated on a different semiconductor substrate. The time duration for these applied voltages is varied and controlled...
Software-based self-test (SBST) is increasingly used for testing processor cores embedded in SoCs, mainly because it allows at-speed, low-cost testing, while requiring limited (if any) hardware modifications to the original design. However, the method requires effective techniques for generating suitable test programs and for monitoring the results. In the case of processor core testing, a particularly...
Distributed software systems are characterized by increasing autonomy. They often have the capability to sense the environment and react to it, discover the presence of other systems and take advantage of their services, adapt and re-configure themselves in accordance with the internal as well as the global state. Testing this kind of systems is challenging, and systematic and automated approaches...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.