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2009 International Conference on Test and Measurement > 2 > 176 - 179
IEEE Transactions on Automation Science and Engineering > 2009 > 6 > 3 > 433 - 442
Linear Algebra and Its Applications > 2007 > 422 > 2-3 > 526-539
2009 International Conference on Test and Measurement > 2 > 176 - 179
IEEE Transactions on Automation Science and Engineering > 2009 > 6 > 3 > 433 - 442
Linear Algebra and Its Applications > 2007 > 422 > 2-3 > 526-539