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We describe a sample holder assembly which can control a sample temperature in a wide range. The assembly is attached to a six-circle surface X-ray diffractometer with an ultrahigh-vacuum chamber. Samples up to 16.5 mm square can be held at constant temperatures between 50 and 1350 K with a tantalum heater on a pyrolytic boron nitride plate and a closed-cycle helium refrigerator. The accuracy of a...
We performed transmission X-ray diffraction (TXD) experiments with a Si(111) sample and an image plate in air. A large number of crystal truncation rod (CTR) scatterings can be collected all at once in transmission geometry by suppressing thermal diffuse scattering from a bulk. This benefit makes us free from time-consuming measurements in surface X-ray diffraction. In addition, intensities along...
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