Search results
Journal of Electronic Testing > 2019 > 35 > 3 > 413-420
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 211 - 215
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 802 - 804
IEEE Transactions on Circuits and Systems for Video Technology > 2017 > 27 > 11 > 2476 - 2489
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2152 - 2160
2016 IEEE International Reliability Physics Symposium (IRPS) > 5C-1-1 - 5C-1-5
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 552 - 558
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2585 - 2591
IEEE Transactions on Circuits and Systems II: Express Briefs > 2015 > 62 > 7 > 666 - 670
IEEE Transactions on Circuits and Systems II: Express Briefs > 2015 > 62 > 4 > 387 - 391
2015 IEEE International Reliability Physics Symposium > 4B.3.1 - 4B.3.5
Electronics Letters > 2015 > 51 > 1 > 50 - 52
2014 IEEE International Reliability Physics Symposium > 5F.3.1 - 5F.3.6