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IEEE Electron Device Letters > 2014 > 35 > 12 > 1284 - 1286
2012 IEEE International Reliability Physics Symposium (IRPS) > 3D.3.1 - 3D.3.5
IEEE Electron Device Letters > 2014 > 35 > 12 > 1284 - 1286
2012 IEEE International Reliability Physics Symposium (IRPS) > 3D.3.1 - 3D.3.5