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A common method to test analog-to-digital converters (ADCs) is sine fitting. If a very large set of samples needs to be processed (long records), the iterative four-parameter sine fit algorithm is very sensitive to the initial estimate of the fundamental frequency. Even a slight error in the initial guess can spoil the fit because of the several local minima in the error surface. We propose a robust...
A common method to test AD converters is the sine fitting. If very large dataset needs to be processed (long records), the iterative four parameter sine fit algorithm is very sensitive to the initial value of the fundamental frequency estimator. Even a very slight error in the initial guess can spoil the fit because of the local minima in the error surface. We propose a robust algorithm to fit the...
A novel strategy to compensate for frequency drifts caused by stiffness changes in resonant microstructures is presented. The proposed compensation method is based on a controlled stiffness modulation of the resonator by an additional feedback loop and extracting the frequency changes caused by the modulated stiffness. The feasibility of the suggested method is verified experimentally by compensating...
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