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An effective method for material characterization with a scanning acoustic microscope (SAM) is presented. The elastic parameters Young's modulus and bulk modulus and the density are determined from one single reflection signal. In contrast to established methods a calibration specimen is not required. Additionally, the thickness of the specimen can be estimated with two reflection signals at different...
The discovery of photoluminescence properties of highly porous silicon, PS, has recently attracted considerable research. To enrich the understanding of this material, we carry out an investigation of its elastic properties which are of great importance in any opto-, nano-, micro-device applications. By considering 80%-and 70%-porosity PS layers, we deduced their SAW velocities (longitudinal, VL,...
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