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With the development of IC manufacturing industry, plastic encapsulated MOS components have been widely applied. Since higher performance requirement from users, the research on the reliability of plastic encapsulated MOS components is especially important. Through researching the common failure mechanism of plastic encapsulated MOS component, the physical and chemical processes of each failure mechanism...
Luminous emittance declination due to interfacial delamination and darkening is a fatal defect for the GaN-based high power light-emitting diodes (LEDs) under a long time service. This letter brought forward an accelerated aging test under 350 mA forward current, 25degC, 54% RH, 256 hours to testify and analysis the abnormal dark stain on the die surface of high power blue LEDs. SEM micrographs show...
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