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CdSe thin films have been prepared by close spaced sublimation technique. The deposited films have been characterized by Scanning Electronic Microscope (SEM), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). XRD patterns have been used to determine the microstructural parameters (crystallite size, lattice parameter) of investigated films. Structural investigations showed that studied...
Co doping CdS nanocrystals were synthesized in aqueous solution using mercaptoacetic acid as stabilizer. The prepared nanocrystals were examined using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Fourier transform infrared (FTIR) and UV-vis absorption spectroscopy (ABS). The cubic zinc blende nanocrystals were determined and the sizes were estimated by XRD. The compositions of...
The effect of the pulsed - laser annealing on the parameters of CdS thin layers in the medium of oxygen was studied. The CdS thin layers were deposited by spray pyrolysis and surface treatment by nanosecond pulses of XeCl - laser. The changes in the layers were characterized by SEM, XRD and XPS. The results showed that a change in the morphology of the surface occurred; a by-surface layer consisted...
Properties of spry pyrolysed CdS layers were changed purposefully using annealing by a pulsed-laser in oxygen ambient. The structural, phase and electrical characteristics before and after annealing have been compared. The layer surface has been studied by SEM, XRD and XPS analyses. The electrical and optic parameters have been measured as well. Layers with different structure and electro-optical...
Thin CdS-layers, formed by vacuum thermal evaporation were put to pulse rate laser treatment in order to receive a CdO-layer as covering on them, through which activation and recrystallization of the layers were carried out. The so formed heterostructure: CdS-CdO was put to thermal treatment for the purpose of changing its properties. The CdO layer was removed after carrying out the activation and...
Te rich CdTe thin films have been prepared by spray pyrolysis technique using a complexing agent ethylene-diamine-tetra-acetic acid (EDTA) in the precursor solution. The films are characterized using XRD, XPS and PL techniques. XRD studies indicates that the films consist of a mixture of CdTe and Te and the Te peak intensity varies with EDTA concentration. XPS study infers that there is a change over...
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