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This paper describes a novel technique for creating the test program sets (TPSs) that are used by automatic test equipment (ATE) to test electronic circuits and devices. This paper presents an architecture consisting of a genetic algorithm (GA) test proposer and a pattern classifier test evaluator. This architecture has been shown to produce optimized test sequences without human intervention. In...
The paper considers the benefits and practicalities of using the Automatic Test Markup Language (ATML) family of Standards in Test Program Set (TPS) development and life cycle maintenance. As part of any TPS development, the exchange of critical information is key to the successful development of a TPS. At a project management level, these manifest themselves at key milestones in a development projects...
In response to the lack of common formats for documenting automatic test information, the Naval Air Systems Command led the creation of the Automatic Test Markup Language (ATML) to standardize the documentation and reporting of automatic test information. ATML defines classes that represent automatic test system (ATS) components, such as test description, test results and instrument description, and...
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