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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 921 - 932
IEEE Transactions on Computers > 2009 > 58 > 2 > 275 - 279
Journal of Electronic Testing > 1997 > 10 > 3 > 197-214
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 921 - 932
IEEE Transactions on Computers > 2009 > 58 > 2 > 275 - 279
Journal of Electronic Testing > 1997 > 10 > 3 > 197-214