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Innovative development of electric power systems is aimed at creating active-adaptive networks. Control of active-adaptive networks is based on usage of primary data measured at voltage and current transformers. In particular, the voltage transformers can be a source of information for devices determining fault location. The problem of fault location (FL) has always been and remains relevant because...
Two major security challenges for integrated circuits (IC) that involve encryption cores are side-channel based attacks and malicious hardware insertions (trojans). Side-channel attacks predominantly use power supply measurements to exploit the correlation of power consumption with the underlying logic operations on an IC. Practical attacks have been demonstrated using power supply traces and either...
This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.
Simultaneous switching noise (SSN) is an important issue for the design and test and actual ICs. In particular, SSN that originates from the internal logic circuitry becomes a serious problem as the speed and density of the internal circuit increase. In this paper, an on-chip monitor is proposed to detect potential logic errors in digital circuits due to the presence of SSN. This monitor checks the...
This document presents a compilation of results from tests performed by iRoC Technologies on SER induced by alpha particles on SRAM memories for technology nodes from 180 nm to 65 nm. The aim of this study is to establish the variation of sensitivity with technology node for SEU and MCU, and to analyze the possible influence of different designs and technological parameters at a given technology node.
Transient faults have become increasingly observable in combinational logic. This is due to the weakening of some inherent protective mechanisms that logic traditionally holds against such flawed spurious events. One of the aforementioned mechanisms relates to the propagation of transient faults along sensitizable paths. Existing literature that relies on logic simulation under estimates the number...
This paper describes a comparative analysis between two topologies of operational amplifiers to design a 40 MS/s 12-bit pipeline analog to digital converter (ADC). The analysis includes AC and transient simulation to select the proper topology. This ADC is implemented in a 0.35 mum AMS CMOS technology with 3.3 V single power supply. The capacitors and selected operational amplifiers were scaled for...
Trust in reference to integrated circuits addresses the concern that the design and/or fabrication of the IC may be purposely altered by an adversary. The insertion of a hardware Trojan involves a deliberate and malicious change to an IC that adds or removes functionality or reduces its reliability. Trojans are designed to disable and/or destroy the IC at some future time or they may serve to leak...
Predicting methods of common mode radiated emission of power bus structure have been investigated. Transient current flows at the power supply terminal was assumed to an exciting source, and the power bus consisted of power and ground planes was assumed to work as antenna of common mode radiation. Two simulation approaches were studied: one is a time-domain response-based approach, and another one...
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