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IEEE Signal Processing Letters > 2010 > 17 > 6 > 559 - 562
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 11 > 2863 - 2869
IEEE Signal Processing Letters > 2010 > 17 > 6 > 559 - 562
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 11 > 2863 - 2869