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IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 208 - 221
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 7 > 869 - 882
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 208 - 221
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 7 > 869 - 882