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For several decades, the output from semiconductor manufacturers has been high volume products with process optimisation being continued throughout the lifetime of the product to ensure a satisfactory yield. However, product lifetimes are continually shrinking to keep pace with market demands. Furthermore there is an increase in dasiafoundrypsila business where product volumes are low; consequently...
This paper describes a design flow for the circuit-level optimization of a technology. The concurrent exploration of device characteristics and library design choices leads to a more application-optimal technology. We illustrate the design flow by: 1) analyzing the impact of buffer cell design, and 2) by optimizing a 130 nm technology for low operational power.
The dramatic increase in leakage current, coupled with the swell in process variability in nano-scaled CMOS technologies, has become a major issue for future IC design. Moreover, due to the spread of leakage power values, leakage variability cannot be neglected anymore. In this work an accurate analytic estimation and modeling methodology has been developed for logic gates leakage under statistical...
This paper addresses the segmentation problem in noisy image based on Fast Edge Integration (FEI) method in active contour model (ACM) and proposes a new statistical active contour model (SACM). Two modifications are performed in FEI method. First, in order to handle noisy images, maximum log-likelihood estimation is used to replace the minimal variance term proposed by Chan and Vese. Second, a penalising...
The ever changing demands on computational resources has information systems managers looking for solutions that are more flexible. Using a ldquobigger boxrdquo that has more and faster processors and permanent storage or more random access memory (RAM) is not a viable solution as the system usage patterns vary. In order for a system to handle the peak load adequately, it will go underutilized much...
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