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Fast Id-Vg measurements on very high performance devices (very low channel ON-resistance) and larger area devices (therefore large gate capacitance) are subject to serious distortions. Methods to minimize these distortions are introduced in this paper; thus expanding the applicable range of this important measurement technique.
The combination of non-linear control and linear control proposed in [1] has a very fast transient response (voltage step from 1 V to 1.5 V in 2 mus). In order to achieve this fast transient response the non-linear scheme is based on measuring the current of the output capacitor of a Buck converter. The design of this current sensor is complex due to parasitic effects such as component tolerances...
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