Search results
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-1.1 - 4B-1.5
IEEE Electron Device Letters > 2017 > 38 > 1 > 99 - 102
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 218 - 225
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 253 - 257
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
Solid-State Electronics > 2016 > 125 > C > 125-132
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 282 - 289
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
IEEE Electron Device Letters > 2016 > 37 > 1 > 74 - 76
2015 IEEE International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
2015 IEEE International Reliability Physics Symposium > 6C.1.1 - 6C.1.6
2015 IEEE International Reliability Physics Symposium > 2E.5.1 - 2E.5.8
2015 IEEE International Reliability Physics Symposium > CD.2.1 - CD.2.5
IEEE Electron Device Letters > 2014 > 35 > 10 > 1004 - 1006
Journal of Microelectromechanical Systems > 2014 > 23 > 6 > 1252 - 1271