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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 76 - 80
IEEE Electron Device Letters > 2011 > 32 > 3 > 342 - 344
IEEE Electron Device Letters > 2009 > 30 > 9 > 937 - 939
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 76 - 80
IEEE Electron Device Letters > 2011 > 32 > 3 > 342 - 344
IEEE Electron Device Letters > 2009 > 30 > 9 > 937 - 939