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In this study, 94NBT-6BT single crystals were grown by flux growth method using uncalcined and calcined 94NBT-6BT powder. Crystal structures and chemical composition of grown crystals were characterized by X-ray diffraction (XRD), energy dispersive X-ray (EDX) and X-ray fluorescence (XRF) technique. Influences of the powder processing type on dielectric and leakage current properties of the grown...
A nondestructive quality evaluation and control procedure for large-area, [001]-cut PZN-8%PT wafers is described. The crystals were grown by the flux technique engineered to promote [001] layer growth of the crystals. The wafers were sliced parallel to the [001] layer growth plane. Curie temperature (T/sub c/) variations, measured with matching arrays of dot electrodes (of 5.0 mm in center-to-center...
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