Wyniki wyszukiwania
Microelectronics Reliability > 2017 > 79 > C > 20-31
2006 1st Electronic Systemintegration Technology Conference > 2 > 903 - 911
Finite Elements in Analysis & Design > 1998 > 30 > 1-2 > 31-45
Microelectronics Reliability > 2017 > 79 > C > 20-31
2006 1st Electronic Systemintegration Technology Conference > 2 > 903 - 911
Finite Elements in Analysis & Design > 1998 > 30 > 1-2 > 31-45