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IEEE Transactions on Pattern Analysis and Machine Intelligence > 2017 > 39 > 6 > 1150 - 1164
Measurement > 2017 > 98 > C > 139-150
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 1 > 222 - 230
IEEE Transactions on Systems, Man, and Cybernetics: Systems > 2017 > 47 > 9 > 2489 - 2502