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Potential induced degradation (PID) has recently been recognized by the industry as a critical PV module durability issue. Many methods to prevent PID have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a potential method for eliminating or minimizing the PID issue either in the factory during manufacturing or in the field after...
It is known that the potential induced degradation (PID) stress of conventional p-base solar cells affects power, shunt resistance, junction recombination, and quantum efficiency (QE). One of the primary solutions to address the PID issue is a modification of chemical and physical properties of antireflection coating (ARC) on the cell surface. Depending on the edge isolation method used during cell...
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