The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Optical backbone operators need to meet the availability requirements specified in the Service Level Agreements (SLAs). While less stringent availability constraints, i.e., less than three 9's might be met by provisioning connections without any protection, more stringent requirements, i.e., five 9's, force operator to use proactive protection strategies. The connection provisioning process becomes...
Domain Wall Memory (DWM) with ultra-high density and comparable read/write latency to DRAM is an attractive replacement for CMOS-based devices. Unlike DRAM, DWM has non-uniform data access latency that is proportional to the number of shift operations. While previous works have demonstrated the feasibility of using DWM as main memory and have proposed different ways to alleviate the impact of shift...
This paper presents novel techniques to accelerate the reconfiguration of degradable very large scale integration arrays. A preprocessing step is used to derive the upper and lower size bounds of the maximum logical array (MLA) such that only those subarrays that possibly contain the MLA are reconfigured, thereby reducing the reconfiguration time and also obtaining a same-sized logical array. In addition,...
Simple ring-oscillator circuit has been used to estimate the degradation in circuit performance due to negative bias temperature instability (NBTI) effect but it fails to isolate the degradation from the NBTI for PMOS and the positive bias temperature instability (PBTI) for NMOS in high-K dielectric/metal gate CMOS technology. In this paper, we propose new circuit structures which monitor the NBTI...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.