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Peak power consumption during test for the low power devices is a major concern [2, 3, 4]. Excessive peak power may result in test failures of functionally good devices. Huge peaks in the instantaneous power consumption will result in high rates of change of current (di/dt) causing adverse noise effects like VDD-drop and ground-bounce [1, 2, 3, 4]. Also, a high frequency of occurrence of high di/dt...
Low power designs create new challenges in design implementation, verification and testing. DFT practice that overlooks test power may result in yield loss/overkill during manufacturing test. This paper addresses the practical problems often encountered during DFT implementation and manufacturing test for complex low power designs.
Issues on power consumption and IR-drop in testing become serious problems. Some troubles, such as tester fails due to too much power consumption or IR-drop, test escapes due to slowed clock cycle, and so on, can happen in test floors. In this paper, we propose a power and noise aware scan test method. In the method, power-aware DFT and power-aware ATPG are executed based on the preliminary power/noise...
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