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This paper presents a rigorous numerical approach to the assessment of electro-thermal instabilities arising in high-power semiconductor devices operating under time-periodic conditions. The methodology is entirely developed in the frequency domain with reference to the Harmonic Balance technique, i.e. no time-domain calculations are required for the determination of the Floquet multipliers exploited...
This paper presents a rigorous numerical approach to the assessment of electro-thermal instabilities arising in high-power semiconductor devices operating under time-periodic conditions. The methodology is entirely developed in the frequency domain with reference to the harmonic balance technique, i.e. no time-domain calculations are required for the determination of the Floquet multipliers exploited...
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