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IEEE Access > 2017 > 5 > 5069 - 5083
2010 International Conference on Electronics and Information Engineering > 2 > V2-288 - V2-291
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 9 > 3347 - 3357
IEEE Access > 2017 > 5 > 5069 - 5083
2010 International Conference on Electronics and Information Engineering > 2 > V2-288 - V2-291
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 9 > 3347 - 3357