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IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 537 - 556
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2003 > 11 > 4 > 701 - 715
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 537 - 556
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2003 > 11 > 4 > 701 - 715