Search results
Applied Surface Science > 2019 > 496 > C
Materials Letters > 2018 > 231 > C > 11-15
Materials Letters > 2018 > 231 > C > 5-7
Materials Science in Semiconductor Processing > 2018 > 87 > C > 7-12
Materials Letters > 2018 > 231 > C > 150-153
Materials Letters > 2018 > 230 > C > 77-79
Applied Surface Science > 2018 > 457 > C > 93-97
Materials Letters > 2018 > 230 > C > 289-292
Materials Letters > 2018 > 230 > C > 72-75
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 86-90
Materials Letters > 2018 > 230 > C > 297-299
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 851-854
Applied Surface Science > 2018 > 456 > C > 980-984
Materials Letters > 2018 > 229 > C > 244-247
Materials Letters > 2018 > 229 > C > 98-102
Materials Letters > 2018 > 229 > C > 236-239
Materials Letters > 2018 > 229 > C > 357-359
Materials Letters > 2018 > 229 > C > 217-220
Materials Letters > 2018 > 229 > C > 178-181
Materials Letters > 2018 > 228 > C > 289-292