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Leakage currents are one of the major design concerns in Deep sub-micron (DSM) technology due to rapid integration of semiconductor industries by reducing the transistor size. Many parameter has been reduces with technology scaling such as Threshold voltage, oxide thickness, channel length and supply voltage (Vdd) has been reduced to keep power consumption under control. As a consequence, the transistor...
Leakage current is the main source of power dissipation in low-frequency digital circuits implemented in deep submicron processes. This contribution introduces a novel active-mode leakage reduction technique for ultra-low-power (ULP) low-frequency applications. It is based on the ULP CMOS logic style achieving negative-VGS self-biasing ULP logic gates have static current reduced by several orders...
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