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Interferometric measuring systems are frequently used in determining the precise changes. The light of the venture property is used in this system which is possible to perform measurements in the nanometer precision. Analysis of data, which are taken from interferometric measurement systems, can be performed by fringe counting, image processing. There are disadvantages of such kinds of methods which...
The paper presents results of numerical analysis of AFM images of a surface of sandblasted Ti6Al7Nb alloys before and after wet etching procedure usually used for preparing commercially viable dental implants. Obtained results demonstrate that etching procedure efficiently cleans the implants as it leaves almost pure Ti-Al-Nb surface with trace amounts of alkali metals and increased hydrophobicity...
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