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A compact negative bias temperature instability (NBTI) model is presented by iteratively solving the RD equations in a simple way. The new compact model can handle arbitrary stress conditions without solving time-consuming equations, and is hence, suitable for analogue/mixed-signal NBTI simulations in SPICE-like environments. The model has been implemented in Cadence ADE with Verilog-A and also takes...
Negative Bias Temperature Instability (NBTI) has become an important reliability concern for nano-scaled Complementary Metal Oxide Semiconductor (CMOS) devices. In this paper, we present an analysis of temperature impact on various sub-processes that contribute to NBTI degradation. We demonstrate our analysis on 90nm industrial design operating in temperature range 25-125?? C. The key temperature...
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