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We present a framework to calculate the thermal resistance of Au-Sn eutectic solder joint (Rth, Au-Sn joint) in high brightness light emitting diode (HB LED) packages whose heat extraction capability controls the optical efficiency and reliability of HB LEDs. Using the transient thermal measurement combined with the structure function based analytical method and the finite element method, we find...
We report on reliability of deep UV (DUV) LEDs with wavelengths ranging from 235 nm to 310 nm. For longer wavelength DUV LEDs, the operation lifetime (50% decrease of output power) exceeds 5,000 hours. The current-voltage characteristics and the emission spectrum remain nearly unchanged during the degradation process. The degradation is sensitive to the operating temperature. The low frequency noise...
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