Wyniki wyszukiwania
IEEE Transactions on Industrial Electronics > 2011 > 58 > 3 > 890 - 904
2009 International Conference on Test and Measurement > 1 > 290 - 293
IEEE Transactions on Industrial Electronics > 2011 > 58 > 3 > 890 - 904
2009 International Conference on Test and Measurement > 1 > 290 - 293