Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 211 - 215
IEEE Transactions on Computers > 2017 > 66 > 6 > 930 - 945
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 4 > 462 - 466
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 519 - 528
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 374 - 381
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2219 - 2226
IEEE Transactions on Reliability > 2016 > 65 > 4 > 1852 - 1863
IEEE Transactions on Industrial Electronics > 2016 > 63 > 11 > 7008 - 7017
IEEE Transactions on Computers > 2016 > 65 > 9 > 2835 - 2847
IEEE Systems Journal > 2016 > 10 > 1 > 53 - 58
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2547 - 2554
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 3080 - 3087
IEEE Transactions on Nuclear Science > 2015 > 62 > 5-2 > 2129 - 2133
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 5 > 849 - 861
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 5 > 893 - 904
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1597 - 1602
IEEE Transactions on Nuclear Science > 2014 > 61 > 3-2 > 1389 - 1399
IEEE Micro > 2014 > 34 > 6 > 20 - 30
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1558 - 1566
IEEE Transactions on Applied Superconductivity > 2014 > 24 > 5 > 1 - 5