The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We propose an advanced approach to accurately estimate wafer-wafer variation of random defect density in each process layer (D0l) using fail bit analysis and critical area simulation. The proposed method formulates D0l estimation using a linear programming model with constraint set of D0l is positive. The D0l estimation results are consistent with the test vehicles. We also illustrate some effective...
The goal of this panel is to discuss some of the following important items: (i) Are conventional yield diagnostics systems good enough at smaller geometries to isolate the defective location on the chip with good accuracy? (ii) Can DFM based hotspots be overlaid with the yield diagnostics callout based X-Y location and accuracy can be achieved for physical failure analysis? (iii) Can yield diagnostics...
We present a generic method for analyzing the effect of process variability in nanoscale circuits. The proposed framework uses kernel and a generic tail probability estimator to eliminate the need for a-priori density choice for the nature of circuit variation. This allows capturing the true nature of the circuit variation from a few random samples of its observed responses. The data-driven, non-parametric,...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.