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As technology is scaled down, supply voltage and gate capacitances are reduced which degrades the reliability of the circuits. For near sub-threshold region design, this causes even more serious reliability issues because the supply voltage is reduced to near the threshold voltage of the devices. Soft error is one such phenomenon which changes internal node voltage due to external noise. Hence it...
Physical effects in deep submicron processes can affect reliability, performance, and even functionality in common circuit building blocks used in data converters. NBTI (Negative Bias Temperature Instability), STI (Shallow Trench Isolation) stress, and NWELL proximity effects will be reviewed and examples are given of circuit topologies and layout practices which can minimize the detrimental aspects...
We present a practical, systematical method for the evaluation of the soft error rate (SER) of microelectronic devices. Existing methodologies, practices and tools are integrated in a common approach while highlighting the need for specific data or tools. The showcased method is particularly adapted for evaluating the SER of very complex microelectronic devices by engineers confronted to increasingly...
The implementation of complex functionality in low-power nano-CMOS technologies leads to enhance susceptibility to parametric disturbances (environmental, and operation-dependent). The purpose of this paper is to present recent improvements on a methodology to exploit power-supply voltage and temperature variations in order to produce fault-tolerant structural solutions. First, the proposed methodology...
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need for on-line error detection and protection for logic gates even at sea level. The error checker is the key element for an on-line detection mechanism. We compare three different checkers for error detection from the point of view of area, power and false error detection rates. We find that the double...
Soft errors induced by cosmic radiation have become an urgent issue for ultra-deep-sub-micron (UDSM) technologies. In this paper, we propose a new radiation hardened by design latch (RHBDL). RHBDL can improve robustness by masking the soft errors induced by SEU and SET. We evaluate the propagation delay, power dissipation and power delay product of RHBDL using SPICE simulations. Compared with existing...
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