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IEEE Solid-State Circuits Magazine > 2014 > 6 > 1 > 37 - 38
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 466 - 473
IEEE Solid-State Circuits Magazine > 2014 > 6 > 1 > 37 - 38
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 466 - 473