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IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 12 > 2131 - 2142
2009 International Conference on Test and Measurement > 1 > 330 - 333
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 12 > 2131 - 2142
2009 International Conference on Test and Measurement > 1 > 330 - 333