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In many DSP applications (image and voice processing, baseband symbol decoding in high quality communication channels) several dBs of SNR loss can be tolerated without noticeable impact on system level performance. For power optimization in such applications, voltage overscaling can be used to operate the arithmetic circuitry slower than the critical circuit path delay while incurring tolerable SNR...
A novel scheme for reducing the test application time in accumulator-based test-pattern generation is presented. The proposed scheme exhibits extremely low demand for hardware. It is based on a decoder whose inputs are driven by a very slow external tester. Experimental results on ISCAS benchmarks substantiate a test-time reduction of 75%-95% when compared to previously published test-set embedding...
In this paper a BISR architecture for embedded memories is presented. The proposed scheme utilises a multiple bank cache-like memory for repairs. Statistical analysis is used for minimisation of the total resources required to achieve a very high fault coverage. Simulation results show that the proposed BISR scheme is characterised by high efficiency and low area overhead, even for high defect densities...
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