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Functional verification is a major hurdle in todaypsilas design flow. Current technologies are not meeting the challenges imposed by design complexity. Dark corners detection is still the simulation bottleneck in the verification process. While functional verification remains not sufficiently mature, test techniques are improved and completely automated, accordingly complex circuits can be tested...
Defective part levels of zero are almost impossible to achieve in an era of complex defects, process variations, and limited testing resources. It is important to ensure that any defects missed during test will impact the end user as little as possible. However, optimizing test sets for superior detection of critical defects requires an understanding of relative fault criticality, and this determination...
A large part of microprocessor cores in use today are designed to be cheap and mass produced. The diagnostic process, which is fundamental to improve yield, has to be as cost effective as possible. This paper presents a novel approach to the construction of diagnosis-oriented software-based test sets for microprocessors. The methodology exploits existing manufacturing test sets designed for software-based...
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