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Dip-coating technique was used to deposit NiZnO thin films on glass substrates at varying withdrawal speed in the range of 150–350mm/s and annealed at 500°C for 4h. X-ray diffraction (XRD) results showed that the deposited NiZnO thin films have a pure wurtzite structure without any significant change in the structure caused by substituting Zn ion with Ni ion. Crystallite size increased from 248 to...
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