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The chemical changes between transparent conducting oxide (TCO) and cadmium sulphide (CdS) layers were analyzed using X-ray photoelectron spectroscopy (XPS). Commercially available indium tin oxide (ITO) and ITO/SnO2 were used as substrates. The CdS layers were deposited in vacuum (~10−2Pa) at two different (low and high) substrate temperatures by close spaced sublimation technique. During the growth...
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