Search results
IEEE Transactions on Industrial Electronics > 2018 > 65 > 2 > 1459 - 1469
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 96 - 109
IEEE Design & Test > 2017 > 34 > 6 > 36 - 45
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 12 > 1407 - 1411
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 11 > 1817 - 1830
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 10 > 1217 - 1221
IEEE Computer Architecture Letters > 2017 > 16 > 2 > 136 - 140
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 6 > 1906 - 1918
IEEE Transactions on Parallel and Distributed Systems > 2017 > 28 > 5 > 1390 - 1402
IEEE Transactions on Image Processing > 2017 > 26 > 5 > 2230 - 2245
IEEE Computer Architecture Letters > 2017 > 16 > 1 > 38 - 41
IEEE Access > 2017 > 5 > 6909 - 6916
IEEE Access > 2017 > 5 > 2747 - 2762
IEEE Transactions on Parallel and Distributed Systems > 2016 > 27 > 11 > 3199 - 3213
IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 10 > 979 - 983
IEEE Transactions on Signal Processing > 2016 > 64 > 16 > 4152 - 4165
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 6 > 2220 - 2233
IEEE Transactions on Computers > 2016 > 65 > 4 > 1283 - 1296
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 813 - 826