The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In this paper, we analyze the relationship between the travel time reliability and the link's saturation, and propose the travel time reliability function based on the volume/capacity ratio. Then the network capacity model based on risk tropism and link travel time reliability are presented based on the generalized cost function, which contains the travel time and the travel time reliability. Also...
Due to the excellent control of DG MOSFETs over the short channel effects, they have been considered as a leading candidate to extend the scaling limit of conventional bulk MOSFETs. However, the hot carrier injection into gate oxides remains a potential problem in reliability field hence altering the device lifetime. In the present paper, a comprehensive drain current model incorporating hot-carrier-induced...
Due to the importance of power/ground network, lots of researches have been made on it. But they only focused on the minimal area of it. By discussion on the relation among Vdd, performance and power consumption, this paper proposes an optimal algorithm using GA and SLP method where area, performance and power consumption can be simultaneously evaluated. As a result, the power/ground network is designed...
As the sizes of (nano-)devices are aggressively scaled deep towards the nanometer range, the design and manufacturing of future (nano-)circuits will become extremely complex and inevitably introduce more defects, while their functioning will be adversely affected by (transient) faults. Therefore, accurately calculating the reliability of future designs will become a very important factor for (nano-)circuit...
Particle impact noise detection (PIND) test is a reliability screening technique for hermetic components, which is prescribed by MIL-STD-883E. Shock process in PIND is very important to detect remainder and ensure the quality of components. Since the control of acceleration is more difficult, the closed-loop control of acceleration is simplified as the closed-loop control of velocity based on assumed...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.