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IEEE Transactions on Semiconductor Manufacturing > 2013 > 26 > 4 > 436 - 441
Journal of Electronic Testing > 2012 > 28 > 5 > 673-683
2007 44th ACM/IEEE Design Automation Conference > 358 - 363
IEEE Design & Test of Computers > 2006 > 23 > 4 > 278 - 293
Journal of Electronic Testing > 2005 > 21 > 3 > 311-322
Journal of Electronic Testing > 2002 > 18 > 3 > 295-304
Journal of Electronic Testing > 2001 > 17 > 3-4 > 219-224