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2013 IEEE International Electron Devices Meeting > 22.5.1 - 22.5.4
IEEE Electron Device Letters > 2013 > 34 > 10 > 1292 - 1294
2012 IEEE International Reliability Physics Symposium (IRPS) > 2E.5.1 - 2E.5.6
IEEE Translation Journal on Magnetics in Japan > 1992 > 7 > 4 > 311 - 316