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IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 340 - 349
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 428 - 436
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 11 > 2143 - 2147
IEEE Design & Test of Computers > 2009 > 26 > 6 > 8 - 17