Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3534 - 3538
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 450 - 457
IEEE Sensors Journal > 2017 > 17 > 3 > 687 - 694
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 12 > 2222 - 2235
IEEE Transactions on Image Processing > 2016 > 25 > 10 > 4829 - 4841
IEEE Geoscience and Remote Sensing Letters > 2016 > 13 > 8 > 1188 - 1192
IEEE Transactions on Antennas and Propagation > 2016 > 64 > 5 > 2050 - 2055
IEEE Transactions on Image Processing > 2016 > 25 > 4 > 1779 - 1792
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 633 - 636
IEEE Transactions on Circuits and Systems II: Express Briefs > 2015 > 62 > 10 > 937 - 941
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 5 > 801 - 809
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 775 - 777
IEEE Transactions on Semiconductor Manufacturing > 2014 > 27 > 1 > 43 - 50
IEEE Wireless Communications Letters > 2013 > 2 > 6 > 623 - 626
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2013 > 32 > 10 > 1546 - 1556
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 8 > 1469 - 1480
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 113 - 123
IEEE Electron Device Letters > 2012 > 33 > 10 > 1360 - 1362
IEEE Transactions on Knowledge and Data Engineering > 2011 > 23 > 5 > 669 - 682
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2011 > 1 > 1 > 30 - 41