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In this work we studied the effect of the magnetron sputtering radio frequency (RF) power on the optical and structural properties of ZnO thin films. The films were characterized by X-ray diffraction (XRD), X-ray reflectometry (XRR) and UV–vis spectroscopy. The XRD results indicate that the films have grown in a wurtzite hexagonal phase with high c-axis (002) preferential orientation. The thickness,...
We study the thermal behaviour of a tri-layer multilayer, designed by inserting a third material, yttrium, into the previously studied Co/Mo2C system. The system is designed to work at near-normal incidence at the wavelength of 14.1nm. The theoretical reflectivity of Co-based multilayer (Co/Mo2C/Y system) is improved up to 54% after the addition of yttrium. Two types of multilayers with different...
Thin films of MoO 3 were prepared on quartz and Si (100) substrates by reactive dc magnetron sputtering of a Mo target in an oxygen and argon atmosphere. The structural and optical changes induced in the films due to post-growth annealing have been systematically studied by Rutherford backscattering (RBS), X-ray diffraction (XRD), X-ray reflectivity (XRR) and by optical methods. RBS studies...
In this work, the effect of post-growth annealing on the structural and optical properties of sputtered zirconium oxide films has been investigated. The temperature dependence of structure, density, and optical constants has been systematically studied by X-ray diffraction, X-ray reflectometry, atomic force microscopy (AFM) and optical spectroscopy. X-ray diffraction studies show no variation in the...
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