Search results
IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Transactions on Multi-Scale Computing Systems > 2017 > 3 > 2 > 72 - 85
IEEE Transactions on Microwave Theory and Techniques > 2012 > 60 > 4 > 1079 - 1085
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 4 > 249 - 253
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 428 - 436
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 458 - 465
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 4 > 603 - 614
IEEE Transactions on Circuits and Systems II: Express Briefs > 2010 > 57 > 10 > 798 - 802
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 2 > 173 - 183
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 305 - 310
IEEE Journal of Solid-State Circuits > 2008 > 43 > 4 > 874 - 880